A new method to measure monoclinic depth profile in zirconia-based ceramics from X-ray diffraction data

Abstract

Abstract In this paper a method to evaluate monoclinic fraction depth profile in zirconia, based on X-ray diffraction at grazing angles, is proposed. The necessary mathematical developments are exposed. The method is numerically tested in different theoretical configurations, and then on zirconia-toughened alumina and on alumina-toughened zirconia. The results show that it is possible to follow both surface fraction and thickness of the monoclinic layer, within the penetration depth of the X-rays. This is a considerable improvement over simple X-ray diffraction measurements. However, its accuracy is limited for high depth, but considerably improved as compared to previous methods.