Turn-on spread determines the size of the switching region in an avalanche transistor

Abstract

It has been shown recently that only a small part of the emitter-base interface in a Si bipolar junction transistor participates in short-pulsing avalanche switching. This lateral current shrinkage attributed to the “winner takes all” effect reduces the transistor switching size from 1600 to ∼100 μm, still remaining much larger than the transistor structure thickness. We show using quasi-3-D transient modelling that the size of the operating perimeter, which is critically important for switching efficiency and device reliability, is determined by competition between lateral turn-on shrinkage and spread. The latter has never been demonstrated in avalanche transistors before.