Statistics of the domain-boundary relocation time in semiconductor superlattices

Abstract

Static domain formation in doped semiconductor superlattices results in several current branches separated by abrupt discontinuities that exhibit hysteresis. The transition from one branch to its adjacent one is studied by time-resolved switching experiments. The mean value of the relocation time increases by more than one order of magnitude, when the final voltage on the adjacent branch is reduced to a value approaching the discontinuity. At the same time, the distribution function of the relocation time changes from a simple Gaussian to a first-passage time form.