Publication | Closed Access
An evaluation of a commercial Échelle spectrometer with intensified charge-coupled device detector for materials analysis by laser-induced plasma spectroscopy
100
Citations
19
References
2001
Year
EngineeringAnalytical InstrumentationPhysicsAtomic Emission SpectroscopyNatural SciencesSpectroscopyLaser SpectroscopyApplied PhysicsMass SpectrometryCommercial éChelle SpectrometerInstrumentationMaterials AnalysisLaser-induced Plasma SpectroscopySpectrochemical AnalysisSpectroscopic Method
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