Characterization of asymmetric rhombohedral twin in epitaxial α-Cr2O3 thin films by X-ray and electron diffraction - Concepedia

Concepedia

Publication | Closed Access

Characterization of asymmetric rhombohedral twin in epitaxial α-Cr2O3 thin films by X-ray and electron diffraction

40

Citations

61

References

2006

Year

Hugo Mändar, Teet Uustare, Jaan Aarik, Aivar Tarre, A. Rosental

Thin Solid Films

Materials ScienceOxide HeterostructuresMaterial AnalysisEngineeringCrystalline DefectsLayered MaterialSurface ScienceApplied PhysicsElectron DiffractionThin FilmsAsymmetric Rhombohedral TwinEpitaxial GrowthCrystallographyThin Film Processing

References

	Year	Citations

Page 1

Page 1