Cryogenic refractive indices and temperature coefficients of cadmium telluride from 6 μm to 22 μm

Abstract

The index of refraction and its variation with wavelength and temperature were measured for cadmium telluride made by chemical vapor deposition (CVD). The measurement at 20 K using liquid helium as coolant is reported for the first time. The refractive index at 10 microm and 20 K is 2.6466, and the average temperature coefficient at 10 microm and in the range 20-80 K is 4.9 x 10(-5)/K.