In situ EELS and TEM observation of silicon carbide irradiated with helium ions at low temperature and successively annealed - Concepedia

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In situ EELS and TEM observation of silicon carbide irradiated with helium ions at low temperature and successively annealed

32

Citations

6

References

1996

Year

K. Hojou, S. Furuno, Kouhei N. Kushita, H. Otsu, Yoshio Furuya, K. Izui

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

Materials ScienceNuclear CeramicIon ImplantationEngineeringTem ObservationApplied PhysicsSilicon CarbideSitu EelsIon EmissionCarbide

References

	Year	Citations

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