Degradation of metal/oxide/semiconductor structures by Fowler-Nordheim tunnelling injection

Dielectric breakdown in electrically stressed thin films of thermal SiO2

E. Harari · Journal of Applied Physics · 1978 · 438 citations

Engineering, Electrical Engineering, Materials Science +17

The physics of SiO2 and its interfaces

W. Beall Fowler · Journal of Colloid and Interface Science · 1980 · 238 citations

Natural Sciences, Materials Science, Physics +10

Avalanche Injection of Electrons into Insulating SiO2 Using MOS Structures

E. H. Nicollian, C. N. Berglund · Journal of Applied Physics · 1970 · 129 citations

Engineering, Electrical Engineering, Materials Engineering +14

High-field electron trapping in SiO2

P. M. Solomon · Journal of Applied Physics · 1977 · 110 citations

Engineering, Electrical Engineering, Materials Science +17

Avalanche Injection of Holes into SiO2

J. Aitken, Donald R. Young · IEEE Transactions on Nuclear Science · 1977 · 108 citations

Engineering, Electrical Engineering, Materials Science +17