Publication | Closed Access

A new model for computation of probabilistic testability in combinational circuits

Circuit ComplexityReliability EngineeringEngineeringNew ModelSoftware TestingVerificationCombinational CircuitsComputer EngineeringFormal MethodsProbabilistic VerificationComputational ComplexityBuilt-in Self-testProbabilistic TestabilityComputer ScienceCombinatorial Testing WorkflowFormal VerificationDesign For TestingAsynchronous Circuits