Publication | Closed Access
High spatial resolution 3D analysis of materials using gallium focused ion beam secondary ion mass spectrometry (FIB SIMS)
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Citations
5
References
1998
Year
Materials ScienceEngineeringMicroscopySpectroscopyMass SpectrometryApplied PhysicsMicroanalysisCollision Cross SectionFib SimsMedicineSpectrochemical AnalysisIon Mobility
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