Using a two-dimensional detector for X-ray powder diffractometry

Abstract

Special software has been developed to calculate the intensity–scattering-angle dependence. Powder diffraction patterns are obtained in a diffractometer with a two-dimensional area detector. The detector used is a planar proportional chamber with fast delay lines. The optimum sample geometry for both the transmission and reflection method is considered. The application of the method for powders and for the investigation of phase transitions in liquid crystals is illustrated.