Publication | Closed Access
RBS-ERDA, XPS and XRD characterizations of PECVD tungsten nitride films
20
Citations
10
References
1998
Year
Materials ScienceMaterials EngineeringX-ray SpectroscopyEngineeringSurface ScienceApplied PhysicsXrd CharacterizationsVacuum DeviceThin FilmsChemical Vapor Deposition
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