The use of linear sums in exhaustive testing

Verification Testing—A Pseudoexhaustive Test Technique

McCluskey · IEEE Transactions on Computers · 1984 · 225 citations

Computing, Computer Engineering, Computer Science +17

Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing

Barzilai, Coppersmith, Rosenberg · IEEE Transactions on Computers · 1983 · 146 citations

Computing, Computer Engineering, Computer Science +8

Exhaustive Test Pattern Generation with Constant Weight Vectors

Tang, Woo · IEEE Transactions on Computers · 1983 · 92 citations

Engineering, Computer Engineering, Computer Science +14

Logic Test Pattern Generation Using Linear Codes

Tang, Chin-Long Chen · IEEE Transactions on Computers · 1984 · 83 citations

Engineering, Computer Engineering, Computer Science +16

The Weighted Syndrome Sums Approach to VLSI Testing

Barzilai, Savir, Markowsky et al. · IEEE Transactions on Computers · 1981 · 59 citations

Engineering, Computer Engineering, Computer Science +11