Journal of Physics E Scientific Instruments · 1985 · 17 citations · 3 references
Natural SciencesMaterials SciencePhysicsElectronic MaterialsInstrumentationOpticsElectron MicroscopyIon ImplantationTransmission Electron MicroscopyHigh-resolution Electron MicroscopyHigh-resolution Transmission Electron MicroscopyIon HeatingIon Implantation EffectsScanning Electron MicroscopyScanning Electron Microscopy Analysis
The authors describe a liquid He cooled stage for the side entry goniometer of the Philips EM400 transmission electron microscope (TEM). A stable temperature of 10K is reached on the specimen. The resolution is 15 AA (1.5 mm) at about 15K. Calculations taking into account electron and ion beam heating are detailed.
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