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Electron beam imaging of the semiconductor-insulator interface
13
Citations
18
References
1975
Year
SemiconductorsElectrical EngineeringSolid State SciencesEngineeringElectron MicroscopyPhysicsApplied PhysicsCondensed Matter PhysicsElectron DiffractionSemiconductor-insulator InterfaceElectron MicroscopeElectron OpticElectron Beam ImagingElectrical Insulation
(1975). Electron beam imaging of the semiconductor-insulator interface. C R C Critical Reviews in Solid State Sciences: Vol. 5, No. 3, pp. 297-311.
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