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Contribution due to excitation by scattered photons in measurements of L x‐ray cross‐sections
37
Citations
10
References
1989
Year
X-ray SpectroscopyN. SinghEngineeringDifferent Secondary ExcitorsX-ray ImagingAnnular Source GeometryOptical PropertiesX-ray TechnologyRadiation ImagingPhotonicsPhysicsX-ray Free-electron LaserNuclear AstrophysicsScattered PhotonsNatural SciencesSpectroscopyX-ray DiffractionApplied PhysicsX-ray OpticL X‐ray Cross‐sections
Abstract The relative contribution to the production of target L x‐rays by the scattered and K x‐ray parts of excitation spectra from different secondary excitors in annular source geometry is estimated. In contrast to the observations of N. Singh et ul., who made similar measurements using triaxial geometry, we found only a small contribution to the production of L x‐rays by the scattered part of the excitation spectrum in comparison with that by the K x‐ray part. We crosschecked the observations by measuring L x‐ray cross‐sections for five elements, Pr, Nd, Sm, Tb and Yb, at 22.6 keV by two methods: (i) using a 109 Cd radioisotope source in the direct excitation mode and (ii) using a secondary excitor of Ag with a 241 Am radioisotope source as the primary excitor, in annular source geometry. The results obtained by the two methods are found to be in good agreement.
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