Low-energy electron diffraction and photoemission study of epitaxial films of Cu on Ag{001}

H. Li, D. Tian, J. J. Quinn, Y. S. Li, F. Jona, P. M. Marcus

Physical review. B, Condensed matter · 1991 · 46 citations · 17 references

Concepts

Abstract

The epitaxy of Cu on Ag{001} is studied by qualitative and quantitative low-energy electron diffraction (LEED) and by angle-resolved photoemission. LEED indicates that ultrathin (two- to three-atomic-layer) films have a limited amount of long-range order, and the ordered component has interlayer spacings of 1.45\ifmmode\pm\else\textpm\fi{}0.06 \AA{}, which compares well with the theoretically determined cubic lattice constant 2.87\ifmmode\pm\else\textpm\fi{}0.06 \AA{} of a metastable body-centered-cubic (bcc) modification of Cu. Thicker (10- to 12-layer) films have almost no long-range order, and photoemission indicates that regions of bcc and fcc Cu coexist amid large amounts of defects.

References

17