W. F. Egelhoff - Concepedia

Author

W. F. Egelhoff

National Institute of Standards and Technology

Also Known As

Egelhoff, W. F., W. F. Egelhoff, W. F. Egelhoff, Jr., W.F Egelhoff, W.F. Egelhoff, W.F. Egelhoff Jr

Publications

1.6K

Citations

H-Index

Concepts

All Affiliations

National Institute of Standards and Technology Institute for Technical Physics and Materials Science

About

W. F. Egelhoff is an author at National Institute of Standards and Technology specializing in applied physics, engineering, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	14	17	1.3K
2	Applied Physics	14	15	1.1K
3	Natural Sciences	6	6	302
4	Education	1	1	29
5	Chemical Engineering	1	1	193

W. F. Egelhoff

Publications

1.3K

Citations

H-Index

Page 1

	Year	Citations
Reflection High-Energy Electron Diffraction (RHEED) Oscillations at 77 K W. F. Egelhoff, I. Jacob Physical Review Letters Materials ScienceEpitaxial GrowthEngineeringPhysicsCrystal Growth Technology	1989	294
Structural study of the epitaxial growth of fcc-Fe films, sandwiches, and superlattices on Cu(100) D. A. Steigerwald, I. Jacob, W. F. Egelhoff Surface Science Materials EngineeringMaterials ScienceMaterial AnalysisEngineeringCrystal Growth Technology	1988	226
A comparison of the magnetic characteristics of nanocrystalline nickel, zinc, and manganese ferrites synthesized by reverse micelle technique R.D.K. Misra, S. Gubbala, A. Kale, Materials Science and Engineering B Materials ScienceMagnetismFerromagnetismChemical EngineeringEngineering	2004	193
Antiferromagnetic coupling in Fe/Cu/Fe and Co/Cu/Co multilayers on Cu(111) W. F. Egelhoff, Mark Kief Physical review. B, Condensed matter EngineeringMagnetic ResonanceMagnetoresistanceMagnetismSuperconductivity	1992	165
X-ray photoelectron and Auger electron forward-scattering studies of lattice expansions and contractions in epitaxial films W. F. Egelhoff, I. Jacob, J. M. Rudd, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films EngineeringElectron DiffractionX-ray PhotoelectronSemiconductor NanostructuresElectron Spectroscopy	1990	73
X-ray photoelectron forward scattering studies of surface segregation in epitaxial Ni–Cu–Ni(100) sandwich structures W. F. Egelhoff Journal of Vacuum Science & Technology A Vacuum Surfaces and Films Forward ScatteringEngineeringDiffusion MechanismX-ray PhotoelectronSemiconductor Nanostructures	1989	47
Growth morphology determination in the initial stages of epitaxy by XPS W. F. Egelhoff Journal of Vacuum Science & Technology A Vacuum Surfaces and Films Materials EngineeringMaterials ScienceGrowth Morphology DeterminationX-ray SpectroscopyEngineering	1984	44
Influence of interface alloying on the magnetic properties of Co/Pd multilayers J. Carrey, A. E. Berkowitz, W. F. Egelhoff, Applied Physics Letters Magnetic PropertiesEngineeringLow-dimensional MagnetismMagnetoelastic MaterialsMagnetic Materials	2003	43
A new tool for studying epitaxy and interfaces: The XPS searchlight effect W. F. Egelhoff Journal of Vacuum Science & Technology A Vacuum Surfaces and Films X-ray SpectroscopyEngineeringXps Peak IntensitiesNew ToolElectron Diffraction	1985	34
Exchange bias relaxation in CoO-biased films R. D. McMichael, C. G. Lee, M. D. Stiles, Journal of Applied Physics Magnetic PropertiesEngineeringExchange Biased FilmsMagnetic ResonanceMagnetic Materials	2000	32

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