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Quantum mechanical modeling of MOSFET gate leakage for high-k gate dielectrics

Device ModelingMosfet Gate LeakageElectrical EngineeringSemiconductor DeviceEngineeringPhysicsNanoelectronicsStress-induced Leakage CurrentBias Temperature InstabilityApplied PhysicsTime-dependent Dielectric BreakdownMicroelectronicsHigh-k Gate DielectricsQuantum Mechanical ModelingElectrical Insulation