Publication | Closed Access
Structural, optical and light scattering properties of post etched RF sputtered ZnO:Al thin films deposited at various substrate temperature
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Citations
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References
2013
Year
Materials ScienceAluminium NitrideOptical MaterialsEngineeringOptical PropertiesOxide ElectronicsApplied PhysicsGallium OxideThin FilmsOptoelectronicsAl Thin FilmsThin Film ProcessingVarious Substrate Temperature
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