Publication | Closed Access
Transmission electron microscope radiation damage of 4H and 6H SiC studied by photoluminescence spectroscopy
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Citations
20
References
2002
Year
Materials SciencePhotoluminescenceEngineeringElectron MicroscopyElectron SpectroscopySpectroscopyApplied PhysicsPhotoluminescence SpectroscopySynchrotron RadiationOptoelectronicsCarbide
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