An energy-based beam hardening model in tomography

Abstract

As a consequence of the polychromatic x-ray source, used in micro-computer tomography (microCT) and in medical CT, the attenuation is no longer a linear function of absorber thickness. If this nonlinear beam hardening effect is not compensated, the reconstructed images will be corrupted by cupping artefacts. In this paper, a bimodal energy model for the detected energy spectrum is presented, which can be used for reduction of artefacts caused by beam hardening in well-specified conditions. Based on the combination of the spectrum of the source and the detector efficiency, the assumption is made that there are two dominant energies which can describe the system. The validity of the proposed model is examined by fitting the model to the experimental datapoints obtained on a microtomograph for different materials and source voltages.