Charged defects on Ge(111)-c(2×8): characterization using STM

Scanning tunneling microscopy of Si(001)

Robert J. Hamers, R. M. Tromp, J. E. Demuth · Physical review. B, Condensed matter · 1986 · 851 citations

Natural Sciences, Materials Science, Physics +17

Si(001) Dimer Structure Observed with Scanning Tunneling Microscopy

R. M. Tromp, Robert J. Hamers, J. E. Demuth · Physical Review Letters · 1985 · 658 citations

Natural Sciences, Materials Science, Physics +17

Scanning tunnelling microscopy of the interaction of hydrogen with silicon surfaces

John J. Boland · Advances In Physics · 1993 · 285 citations

Natural Sciences, Materials Engineering, Materials Science +17

Tunneling microscopy of Ge(001)

Joel Kubby, J. E. Griffith, R. S. Becker et al. · Physical review. B, Condensed matter · 1987 · 269 citations

Natural Sciences, Materials Science, Physics +15

Dimer–adatom–stacking-fault (DAS) and non-DAS (111) semiconductor surfaces: A comparison of Ge(111)-c(2×8) to Si(111)-(2×2), -(5×5), -(7×7), and -(9×9) with scanning tunneling microscopy

R. S. Becker, B. S. Swartzentruber, J. S. Vickers et al. · Physical review. B, Condensed matter · 1989 · 231 citations

Natural Sciences, Chemistry, Materials Science +17