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RHEED-intensity oscillations of alternating surface reconstructions during Si MBE growth on single-domain Si(001)-2×1 surface

Surface CharacterizationEngineeringPhysicsSingle-domain SiSurface AnalysisSurface ScienceApplied PhysicsSemiconductor Device FabricationSi Mbe GrowthRheed-intensity OscillationsSilicon On InsulatorSurface Reconstruction