Surface Science · 1971 · 25 citations · 10 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsSpectroscopySurface ScienceAuger Electron SpectroscopyElectronic Material CharacterizationOptical Properties Of SemiconductorsSemiconductor Device MaterialsSemiconductor SurfacesSilicon MaterialsAuger Line Shape AnalysisPeak Shape AnalysisSiliconSilicon CharacterizationSilicon Surface Science
10
Inelastic effects in Auger electron spectroscopy
W. M. Mularie, Thomas Rusch · Surface Science · 1970 · 45 citations