Applied Physics A · 1990 · 14 citations · 19 references
Materials ScienceIon ImplantationEngineeringPhysicsTi-cu SystemSurface ScienceApplied PhysicsCondensed Matter PhysicsIon BeamVacuum DeviceIon Emission
19
The depth resolution of sputter profiling
H. H. Andersen · Applied Physics A · 1979 · 596 citations
Role of thermal spikes in energetic displacement cascades
T. Dı́az de la Rubia, R. S. Averback, R. Benedek et al. · Physical Review Letters · 1987 · 395 citations
Engineering, Material Simulation, Computational Chemistry +24