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Retrieval of Permittivity and Permeability of Homogeneous Materials from Scattering Parameters
57
Citations
16
References
2010
Year
Optical MaterialsEngineeringNegative-index MetamaterialMetamaterialsNicholson-ross-weir Retrieval ProcedureScattering ParametersPhysical PropertyElectromagnetic MetamaterialsSurface ReflectanceOptical PropertiesComputational ElectromagneticsHomogeneous MaterialsReflectanceProduct μεMaterials SciencePhysicsMaterial PropertyMicrowave MeasurementElectrical PropertyMaterials CharacterizationApplied PhysicsWave ScatteringLight ScatteringWater Surface Reflectance
Abstract On the basis of measured scattering parameters, we present a general assessment of the main problems with the Nicholson-Ross-Weir retrieval procedure: First, the inherent instability of the method for low-loss materials at frequencies corresponding to integer multiples of the transmitted wavelength in the sample; second, the multivalued solutions for the complex wavenumber when the electrical length of the sample exceeds a wavelenghth. It is shown that the presence of small perturbation or noise on the transmission coefficient T at around |T| ≈ 1 suffices to trigger the instability when retrieving the impedance of the sample. Unlike the ill-conditioned expression of the impedance, the product με (refractive index squared) is stable to perturbation in T. For nonmagnetic materials (relative permeability μr = 1), therefore, the product με reduces to the complex permittivity, which is then correctly retrieved without divergent ripples as shown by the extracted permittivity spectra in the X-band (8.2–12.4 GHz) for a slab sample of Teflon of arbitrary thickness.
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