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Characterization of silicon carbide surfaces of 6H-, 15R- and 3C-polytypes by optical second-harmonic generation in comparison with X-ray diffraction techniques

Materials ScienceSurface CharacterizationIi-vi SemiconductorOptical MaterialsEngineeringOptical PropertiesSurface AnalysisSurface ScienceApplied PhysicsOptical Second-harmonic GenerationSilicon Carbide SurfacesX-ray Diffraction TechniquesCarbide