Characterization of multilayer reflectors and position sensitive detectors in the 45–300 Å region

Abstract

Multilayer reflectors and position sensitive detectors have been developed in constructing imaging optical systems in the 45–300 Å region. Molybdenum-silicon (2d=140 Å, N=20) and nickel–carbon (2d=100 Å, N=20) multilayers were deposited on a spherical mirror (25 cm in diameter) for the normal incidence and on a segment of paraboloidal mirror (20 cm×10 cm) for 30° grazing incidence. Their optical characteristics were evaluated by using characteristic x rays and monochromatized synchrotron radiation in the 45–300 Å region. A position sensitive detector is made of a tandem microchannel plate (MCP) with a CsI photocathode and resistive plate, which is placed at the focal plane of each mirror. The detection efficiency and position resolution were measured by using characteristic x rays of CKα and monochromatized synchrotron radiation in the 45–200 Å region.