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SUPERSTRUCTURE FORMATION AND X-RAY PHOTOEMISSION PROPERTIES OF THE <font>TlTiOPO</font><sub>4</sub> SURFACE
36
Citations
10
References
2004
Year
Materials ScienceInorganic ChemistryKtiopo 4X-ray SpectroscopyEngineeringPhysicsTheoretical Inorganic ChemistryOptical PropertiesX-ray Photoemission SpectroscopyNatural SciencesApplied PhysicsCondensed Matter PhysicsX-ray DiffractionOxide ElectronicsFunctional MaterialsCrystal FamilyChemistryCrystallography
X-ray photoemission spectroscopy (XPS) measurements have been executed for TlTiOPO 4 to elucidate the general features in the electronic structure of the KTiOPO 4 family compounds. The peculiarities of the valence band structure have been discussed for the crystals. The persistence of core level binding energy differences O 1s–P 2p and O 1s–Ti 2p 3/2 has been detected in TlTiOPO 4 and KTiOPO 4 , which relates well with the constancy of averaged P – O and Ti – O chemical bond lengths in this crystal family. The superstructure ordering of the TlTiOPO 4 surface subjected to polishing and annealing has been detected by reflectance high energy electron diffraction (RHEED). From comparison of surface crystallographic properties of TlTiOPO 4 and KTiOPO 4 , the most typical superstructure indices have been revealed.
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