Direct link between<i>1/f</i>noise and defects in metal films

Abstract

We have found that gently annealing a AuPd film has a substantial effect on its 1/f noise. From the temperature dependence of the noise after various amounts of annealing, one can infer changes in the distribution of activation energies of the process responsible for the noise. These changes are consistent with general expectations concerning the effect of annealing on lattice defects. Our results strongly support the idea that at least some of the 1/f noise of metal films is associated with defect motion.