Publication | Closed Access
Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates
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Citations
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References
2001
Year
Semiconductor TechnologyWide-bandgap SemiconductorElectrical EngineeringEngineeringOptical PropertiesApplied PhysicsGan Power DeviceSilicon SubstratesGan Epitaxial LayersReflectance Analysis
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