Micron · 2010 · 29 citations · 34 references
Natural SciencesMaterials SciencePhysicsElectromagnetismSurface ScienceThin FilmsDielectricsElectrical ConductivityElectron Beam PhysicsSurface ChargeThin Film Electrical PropertiesThin-film MaterialsBeam Interactions With MatterElectron Beam FocusingElectrostatic Surface PotentialLow-energy Electron BeamsScreened Coulomb PotentialSurface PotentialSurface Potential Measurement
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Low voltage scanning electron microscopy
David C. Joy, Carolyn S. Joy · Micron · 1996 · 322 citations
Calculations of Mott scattering cross section
Zbigniew Czyżewski, Danny O’Neill MacCallum, A. D. Romig et al. · Journal of Applied Physics · 1990 · 257 citations
Electron beam charging of insulators: A self-consistent flight-drift model
Matthieu Touzin, C. Guerret-Piécourt, D. Juvé et al. · Journal of Applied Physics · 2006 · 114 citations · Full text