Surface Investigations Using the Positron Reemission Microscope

Abstract

We have constructed a positron reemission microscope and taken images of a number of targets using it. The unique image contrast of this device is determined by the probability that positrons are remitted from a specimen surface. The surface and near-surface defect sensitivity of the positron reemission microscope is demonstrated, as well as the feasibility of imaging biological specimens and semiconductor devices. Applications are discussed.