Journal of Applied Physics · 1963 · 56 citations · 1 references
Natural SciencesMaterials EngineeringMaterials ScienceMaterials PhysicsMetallic MaterialsThin FilmsDiffusion In SolidsMetal MaterialsMetalsX-ray CrystallographyX-ray DiffractionX-ray SpectroscopyDiffraction Pattern AnalysisEffective Diffusion CoefficientEffective Half-lifeLayered SystemSoft X-ray OpticsSoft X-ray SpectroscopyX-ray Diffraction Analysis
Artificial layered structures that produce sharp diffraction of x rays are described. The structures were made by alternately evaporating 140 Pb and Mg layers onto a glass slide (d=27 Å). The diffracting efficiency of the layered structures is compared with other structures used in soft x-ray spectroscopy. The usefulness of the structures is limited by diffusion in the layered system which caused the diffraction pattern to decay to half intensity in 2 days at room temperature. At 0°C the half life was 5 weeks. The diffusion model of DuMond and Youtz was used to determine an effective diffusion constant for the system over the temperature range 0–62°C. The equation Deff=5.2×10−6 exp(−20 600/RT) cm2/sec was satisfied.
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