Journal of Energetic Materials · 2001 · 13 citations · 2 references
Natural SciencesChemistryMaterials ScienceAnalytical ChemistryMass Spectrometric AnalysisSpectroscopyBiological Effects Of RadiationGamma-ray SpectroscopyHighly Charged IonsMass SpectrometryRadiation ChemistryRadiation SensitivityGamma Irradiation EffectsGamma-ray SpectrometryLow-energy Electron BeamsLow-energy Electron SpectroscopySecondary Ion Mass SpectrometrySurface CompositionTime-of-flight Mass SpectrometryTime-of-flight Secondary Ion Mass Spectrometry
Abstract Highly Charged Ion (HCI) Time-of-Flight (TOF) Secondary Ion Mass Spectrometry (SIMS) has been employed to analyze the changes in the surface composition of TATB caused by low energy electron, ultraviolet, and Gamma ray irradiation. Comparisons are made between canary yellow (not irradiated) TATB and TATB that has been “greened” by exposure to radiation. We ascribe the color change from yellow to green to a loss of oxygen. Another striking aspect of this study is the presence of a feature at m/z = 30 (NO+) for highly charged ion SIMS, which does not occur in singly charged ion TOF SIMS.
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Interaction of slow, very highly charged ions with surfaces
T. Schenkel, A. V. Hamza, A. V. Barnes et al. · Progress in Surface Science · 1999 · 218 citations
Natural Sciences, Chemistry, Physics +10