Publication | Closed Access
Proximity Effects of Interconnection Lines in High Speed Integrated Logic Circuits
11
Citations
4
References
2006
Year
Unknown Venue
Propagation MatricesEngineeringVlsi DesignComputer ArchitectureInterconnect (Integrated Circuits)Electromagnetic CompatibilityPhysical Design (Electronics)Proximity EffectsElectric Power TransmissionComputational ElectromagneticsElectronic PackagingCircuit AnalysisElectrical EngineeringComputer EngineeringInterconnection NetworkMicroelectronicsVlsi ArchitectureTransmission LineInterconnection Lines
The proximity and coupling effects between interconnection lines in V.S.L.I. circuits are studied by evaluating the power in the circuit. The coupling and propagation matrices and the exact current distribution in the conductors are established. The results of computation show that the losses and the dispersions in the lines are increased by proximity effects.
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