SIMS on ZnO surfaces: The influence of space charge accumulation layers on secondary ion yields and measurement of true hydrogen concentration

On the problem of water adsorption on alkali halide cleavage planes, investigated by secondary ion mass spectroscopy

J Estel, H. Hoinkes, H. Kaarmann et al. · Surface Science · 1976 · 198 citations

Natural Sciences, Chemical Engineering, Chemistry +16

Work function and band bending on clean cleaved zinc oxide surfaces

H. Moormann, D. Köhl, G. Heiland · Surface Science · 1979 · 126 citations

Natural Sciences, Materials Engineering, Materials Science +16

Relation between physical and chemical processes on semiconductor surfaces

A. Many · C R C Critical Reviews in Solid State Sciences · 1973 · 61 citations

Natural Sciences, Chemistry, Physics +17

The ZnO-crystal as sensitive and selective detector for atomic hydrogen beams

K. Haberrecker, E. Mollwo, Horst Schreiber et al. · Nuclear Instruments and Methods · 1967 · 52 citations

Natural Sciences, Materials Science, Physics +13

Low-energy ion scattering (LEIS) for composition and structure analysis of the outer surface

H.H. Brongersma, T.M. Buck · Nuclear Instruments and Methods · 1978 · 44 citations

Natural Sciences, Materials Science, Spectroscopy +12