Journal of Analytical Atomic Spectrometry · 2014 · 11 citations · 27 references
Natural SciencesChemistryMaterials ScienceAnalytical ChemistryElemental AnalysisSpectroscopyElemental Composition AnalysisInorganic Elemental AnalysisInstrumental AnalysisOptical SpectroscopySilicon MaterialsTrace Element AnalysisElectronic Grade SiliconSample Preparation Protocol ValidationSilicon Speciation
A sample preparation protocol for accurate B quantification in metallurgical grade Si by ICP-OES is described and validated against PGAA.
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