Surface-extended x-ray-absorption fine-structure experiments at atmospheric pressure by means of a photocathode proportional counter with monolayer sensitivity

Abstract

Surface-extended x-ray-absorption fine-structure measurements at atmospheric pressure were made by means of a new photocathode proportional counter on the oxide films that form on bulk iron substrates. Both thermally formed and chemically formed films were studied. Near-edge spectra with effective monolayer sensitivity were used to investigate the ionicity of cations in ultrathin films.