Publication | Closed Access
Diffusion of Fluorine in Silica
16
Citations
4
References
1987
Year
Chemical EngineeringEngineeringDiffusion ResistanceDiffusion ProfilesSurface ScienceDiffusion ProcessTransport PhenomenaPhysical ChemistryInterfacial StudyChemistryChemical KineticsChemical Vapor DepositionLeast Squares
Abstract Diffusion constants of fluorine in silica were determined at temperatures between 1385 K and 1873 K. Samples were prepared by the PCVD (Plasma activated Chemical Vapor Deposition) method and diffusion profiles measured by SEM investigations. The resulting least squares fit is log( D (cm 2 s −1 )) = ‐0.920 ‐ 18337 K/ T .
| Year | Citations | |
|---|---|---|
Page 1
Page 1