Journal of Physics F Metal Physics · 1988 · 36 citations · 24 references
Natural SciencesMaterials SciencePhysicsElectronic MaterialsInorganic ChemistryMaterials PhysicsDefects In Electronic MaterialsHydrogen AtomIon ImplantationRadiation Damage In MaterialsDefect AnalysisDefect KineticsDefect MigrationHydrogen Bonding InteractionsVacancy Formation
The defect recovery in Ni and the influence of hydrogen on the recovery have been studied by means of the positron lifetime technique. Icosahedral annealings after irradiation at 20 K show the free migration of interstitials in stage I around 55 K. Free migration of vacancies (state III) is seen above 320 K, where the agglomeration of vacancies is clearly observed. Hydrogen, introduced by implantation at 20 K or electrolytically at 295 K, is found to become trapped at the vacancies. The hydrogen-vacancy pairs dissociate around 305 K, below the vacancy migration temperature. The binding energy of hydrogen to a vacancy is deduced to be 0.57+or-0.04 eV.
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Edward M. Eyring · Nuclear Technology · 1978 · 1.3K citations
Defect trapping of gas atoms in metals
S. T. Picraux · Nuclear Instruments and Methods · 1981 · 157 citations