A new method to detect surface steps by specularly reflected fast ions - Concepedia

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A new method to detect surface steps by specularly reflected fast ions

37

Citations

4

References

1988

Year

Michi-hiko Mannami, Yoshikazu Fujii, Kenji Kimura

Surface Science

EngineeringAnalytical InstrumentationPhysicsMicroscopyNatural SciencesSpectroscopyApplied PhysicsSurface StepsAnalytical ChemistryInstrumentationIon EmissionCation SensingFast IonsNew MethodIon Mobility

References

	Year	Citations

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