Applied Optics · 1986 · 34 citations · 3 references
Natural SciencesPhysicsBiomedical OpticsOpticsPhotographyImagingInterferometryOptical Metrology
Get PDF Email Share Share with Facebook Tweet This Post on reddit Share with LinkedIn Add to CiteULike Add to Mendeley Add to BibSonomy Get Citation Copy Citation Text C. Joenathan and R. S. Sirohi, "Enhancement of sensitivity in in-plane measurement in speckle photography," Appl. Opt. 25, 1380-1380 (1986) Export Citation BibTex Endnote (RIS) HTML Plain Text Citation alert Save article
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Use of holographic optical elements in speckle metrology: part 2
Chandra Shakher, G. Venkata Rao · Applied Optics · 1987 · 25 citations
Natural Sciences, Physics, Optics +12
Hololens in speckle and speckle shear interferometry
C. Joenathan, Rakesh Mohanty, Rajpal S. Sirohi · Applied Optics · 1985 · 23 citations
Use of holographic optical elements in speckle metrology
Chandra Shakher, G. Venkata Rao · Applied Optics · 1984 · 17 citations