Publication | Open Access
Tip-surface forces, amplitude, and energy dissipation in amplitude-modulation (tapping mode) force microscopy
228
Citations
25
References
2001
Year
EngineeringMicroscopyMechanical EngineeringForce MicroscopyEnergy DissipationAmplitude ReductionMicroscopy MethodMechanicsLight MicroscopyNanomechanicsBiophysicsPhysicsScanning Probe MicroscopySurface ScienceApplied PhysicsScanning Force MicroscopyTip-surface ForcesOscillation AmplitudeHigh Resolution ImagingMedicineAcoustic Microscopy
Amplitude-modulation (tapping mode) atomic force microscopy is a technique for high resolution imaging of a wide variety of surfaces in air and liquid environments. Here by using the virial theorem and energy conservation principles we have derived analytical relationships between the oscillation amplitude, phase shift, and average tip-surface forces. We find that the average value of the interaction force and oscillation and the average power dissipated by the tip-surface interaction are the quantities that control the amplitude reduction. The agreement obtained between analytical and numerical results supports the analytical method.
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