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Nonstoichiometry-Induced Carrier Modification in Gapless Type Atomic Switch Device Using Cu<sub>2</sub>S Mixed Conductor
32
Citations
15
References
2009
Year
SemiconductorsElectrical EngineeringElectronic DevicesEngineeringElectronic MaterialsPhysicsApplied PhysicsAc ImpedanceDc PolarizationCharge Carrier TransportCu2s Thin FilmSemiconductor MaterialThin FilmsNonstoichiometry-induced Carrier ModificationMicroelectronicsCharge TransportSemiconductor Device
Both ac impedance and dc polarization have been measured to investigate the switching property of a Cu2S gapless type atomic switch with two-probe cells composed of asymmetric configuration of ion blocking and reversible electrodes in addition to symmetric one with reversible electrodes. Strong nonlinear p-type conductivity in current–voltage (I–V) characteristics and a marked change of overall ac impedance with the variation of applied dc bias voltage observed are attributed to the nonstoichiometry induced carrier modification in a Cu2S thin film modulated by the Cu vacancy migration under the presence of an electrical potential field.
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