Publication | Closed Access
Electrical characteristics of large scale integration (LSI) MOSFETs at very high temperatures part I: Theory
57
Citations
20
References
1984
Year
Device ModelingElectrical CharacteristicsElectrical EngineeringEngineeringNanoelectronicsBias Temperature InstabilityLarge Scale IntegrationThermodynamicsElectronic PackagingHeat TransferMicroelectronicsThermal EngineeringHigh Temperatures PartInterconnect (Integrated Circuits)Semiconductor Device
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