Spectral dependence of noise on gate bias in n-MOSFETS - Concepedia

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Spectral dependence of noise on gate bias in n-MOSFETS

98

Citations

13

References

1987

Year

Zeynep Çelik‐Butler, T.Y. Hsiang

Solid-State Electronics

EngineeringPhysicsElectronic EngineeringBias Temperature InstabilityNoiseSpectral DependenceMicroelectronicsSemiconductor Device

References

	Year	Citations

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