Structural Analysis of Ag–In–Sb–Te Phase-Change Material

Abstract

The Ag–In–Sb–Te system is widely used for phase-change discs such as compact disc rewritable (CD-RW) and rewritable digital versatile disc (DVD+RW). To clarify the effect of Ag and In in the Ag–In–Sb–Te system, we studied the local structure of Ag–In–Sb–Te phase-change material by extended X-ray absorption fine structure (EXAFS). The results suggest that the existence of Ag contributes to the thermal stability of amorphous marks and existence of In contributes to high-speed phase-change.