Laue distribution of large values of time delay of electrical breakdown in nitrogen

Abstract

This paper gives the Laue distribution of time delay of electrical breakdown (td) for five pressure values of nitrogen in gas-filled diodes. Distributions were obtained for 20% overvoltage, and passive time ( tau ) 5 s and 7.2*103 s. The breakdown in nitrogen is induced by long-lived metastable states formed in the previous gas ionisation. The results show that the Laue distributions also hold for such groups of data when td varies between a fraction of a second and several hundreds of seconds.